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The technical results are provided and an intuitive explanation for them is also given
are not portable
3Ziel dieser Arbeit2
- X Rays and Beta Rays
Advances in X-ray Analysis formatIsbn:Softcover - 9781461399834 The technical results are providedX ray diffraction as a method of qualitative analysis for crystal line phases has been long accepted, and has had constant improvement in method and equipment. It has also been made more useful by the growth and improvement of the data collection available as reference standards. In recent years some attempts have been made to use the method to a greater extent by furnishing results on a quantitative basis. This has proved to be difficult because of
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